Scanning Electron Microscope
Name: Scanning Electron Microscope
Manufacturer: FEI of America
Purchasing date: November, 2005
Main technical indicator: Resolution: 3.5nm
Common accessories: spectrometer, EBSD, stretching table
Main application area: metallic materials
Main function: material surface morphology observation, crystal orientation analysis of micro-area composition and the polycrystalline materials.
Person in charge of the equipment: Wang Jiafu
Ways of contact:
Tel：83673168
E-mail：
Location: Room 134, RAL
Operating procedures
- Before starting, check the power connection and equipment switch state;
- Power on host power of electron microscope;
- Operate XT-microscope software;
- Put clean sample into the sample chamber correctly, and then close the sample chamber;
- Pull the manual valve (EB) to a proper vacuum mode;
- Click the ‘vacuuming’ button to get vacuum condition;
- Adjustment parameters (accelerating voltage, the beam spot size, the magnification and the scanning rate, etc.);
- After observation and analysis, stop high-pressure first. Never deflate until the filament cooled down. Replace the sample.
- After experiment, set the system in the proper state (off mode, standby mode and night mode) according to its actual condition.